Semiconductor Engineering

SRAM Cell Scaling With Monolithic 3D Integration Of 2D FETs (Penn State)

A new technical paper titled “Enabling static random-access memory cell scaling with monolithic 3D integration of 2D field-effect transistors” was published by researchers at The Pennsylvania State ...
Semiconductor Engineering

Noise Margin Enhancing ULVR SRAM Cell (Tokyo Institute of Technology)

A new technical paper titled “A New Ultralow-Voltage Retention SRAM Cell Enhancing Noise Immunity” was published by researchers at the Tokyo Institute of Technology. “A new ultralow-voltage retention ...