电子工程专辑

ATPG性能改善情况的正确衡量方法

集成电路测试的目的是希望在一批器件中找出有缺陷的器件，从而将交付的DPPM(每百万器件中的缺陷器件数目)降低至100以下。通过对自动测试图样生成(ATPG)算法进行一些设计修改，就可能在合理的测试图样数目下达到较高的缺陷覆盖率。本文描述了在评估不同 ...
电子工程专辑

Magma发表Talus ATPG与Talus ATPGX，具有片上扫描链压缩功能

芯片设计解决方案供应公司微捷码(Magma)设计自动化公司，发表有片上扫描链压缩功能的Talus ATPG与Talus ATPGX。这些先进的自动测试向量生成(ATPG)产品使设计师能明显改进测试质量，减少周转时间并且降低纳米级芯片的成本。 芯片设计解决方案供应公司微捷码 ...
Design-Reuse

An Introduction about ATPG in VLSI

VLSI or Very Large Scale Integration has emerged as a crucial field in electronics engineering over the past few years. With the manufacture of complex integrated circuits (ICs) with millions of ...
Semiconductor Engineering

Better ATPG To Minimize Chip Test Time And Cost

As chips get ever bigger and more complex, the electronic design automation (EDA) industry must innovate constantly to keep up. Engineers expect every new generation of silicon to be modeled, ...
Electronic Design

What’s The Difference Between Scan ATPG And IJTAG Pattern Retargeting?

Both scan automated test pattern generation (ATPG) patterns and IJTAG patterns 1,2,3 are created for a piece of logic that is part of a much larger design. For both, the patterns are independent from ...
Electronic Design

What’s The Difference Between ATPG And Logic BIST?

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...