A far infrared reflectometer attachment designed for the Thermo-Nicolet line of FTIR spectrometers. As a system, the SPECTRAFIRE and Thermo-Nicolet spectrometer provides a Fourier transform infrared ...
Measures spectral IR total hemispherical reflectance, 2.5-25 microns (most surfaces). Integration of reflectance is used to calculate and display emittance. A unique instrument for easily and quickly ...
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