The Model 104A-1 Thermo-Probe probe tests components by applying pinpoint heat accurate to within ±1°C. Used to test devices such as diodes, resistors, and transistors, the probe takes seconds to heat ...

TANAKA Kikinzoku Kogyo K.K. (Head office: Chuo-ku, Tokyo; Representative Director & CEO: Koichiro Tanaka), which develops industrial precious metal products as one of the core companies of TANAKA ...

Tanaka Precious Metal Technologies has developed TK-SR, a rhodium-based material for probe pins used in probe cards during semiconductor front-end testing. Save my User ID and Password Some ...

IC test interface solution providers, which include probe cards and IC test sockets, are engaged in price negotiations with their fabless clients as demand for wireless devices falls, according to ...

FormFactor is experiencing strong growth in high-bandwidth memory (HBM) probe card demand, with HBM revenue nearly doubling in Q1 2024 compared to H2 2023. The company is benefiting from the increased ...

FormFactor, Inc. has completed its acquisition of FICT Limited in partnership with MBK Partners, investing approximately $60 million for a 20% non-controlling stake, which also grants FormFactor a ...

During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...

Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.

The need for high-frequency semiconductor devices is surging, fueled by growing demand for advanced telecommunications, faster sensors, and increasingly autonomous vehicles. The advent of ...

Scientists are striving to discover new semiconductor materials that could boost the efficiency of solar cells and other electronics. But the pace of innovation is bottlenecked by the speed at which ...