电子工程专辑

EDA工具资料包(即将下线)：应对FPGA、ASIC等IC设计的功能验证挑战

2025年6月，西门子EDA的 Questa™ One 智能验证解决方案正式上市。该方案以人工智能（AI）技术赋能连接性、数据驱动方法和可扩展性，突破集成电路 (IC) 验证流程限制，并提供更快引擎，支持从 IP 到芯片级系统 (SoC) 再到大型系统的大规模复杂设计，同时在开发时 ...
电子工程专辑

西门子EDA工具资料包：应对FPGA、ASIC等IC设计的功能验证挑战

2025年6月，西门子EDA的 Questa™ One 智能验证解决方案正式上市。该方案以人工智能（AI）技术赋能连接性、数据驱动方法和可扩展性，突破集成电路 (IC) 验证流程限制，并提供更快引擎，支持从 IP 到芯片级系统 (SoC) 再到大型系统的大规模复杂设计，同时在开发时 ...
Business Wire

Titan IC Has Licensed its RegEx Processor to Silicom Ltd for Advanced FPGA SmartNIC Platforms

SAN FRANCISCO--(BUSINESS WIRE)--Titan IC today announced that they have licensed their 40Gb/s Helios RXPF Regular Expression Processor to Silicom Ltd to further enhance their new FPGA SmartNIC ...
EDN

Triple-channel power IC simplifies FPGA design

Designed for Xilinx�s Spartan-II/IIE/3 series FPGAs, the TPS75003 power management IC reduces the number of external components required to power a complete FPGA system used in consumer, ...
EDN

Small customizable IC has FPGA, analog

The GreenPAK customizable IC has a one-time-programmable micro-FPGA with configurable analog components and can perform many 4- and 8-bit MCU applications. The IC has a finite state machine, logic, ...
Electronic Design

IC Vendors Craft FPGA Power Solutions

Altera Corp., in conjunction with Bellnix Co. Ltd., Linear Technology, National Semiconductor, Texas Instruments Inc. and Volterra Semiconductor Corp., recently announced the availability of a ...
Digi Times

From FPGA to AI: Fudan Microelectronics confronts US FN4 blacklist head-on

Shanghai Fudan Microelectronics Group (FMSH), one of China's major IC design companies, has been placed on the US Commerce Department's Entity List with the strict Footnote 4 (FN4) designation. The ...
Nasdaq

Peraso Announces Knowledge Resources Has Chosen BE-3 Memory IC for FPGA Acceleration

SAN JOSE, CA / ACCESSWIRE / June 23, 2022 / Peraso Inc. (NASDAQ:PRSO) (Peraso®), a leader in mmWave technology, today announced thatKnowledge Resources GmbH, a sophisticated Electronics Design ...
TechRepublic

FPGA Based Digital IC Tester

In this paper, the authors describe the implementation of testing of CMOS (Complementary Metal-Oxide-Semiconductor) digital integrated circuits for both functional and delay fault testing using ...