MBIST是Memory Build-In-Self Test的简称，意为存储器内建自测试。“内建”的含义是指针对存储器的测试向量不是由外部测试机台生成，而是由内建的存储器测试逻辑自动产生，并进行结果的对比。MBIST测试中，只需要从机台通过JTAG标准接口下达测试的指令，就可以从 ...

SAN JOSE, Calif., Nov. 14, 2016 – Cadence Design Systems, Inc. (NASDAQ: CDNS) today announced that the Cadence ® Modus ™ Test Solution now supports the Arm ® Memory Built-In Self Test (MBIST) ...

Recent surveys of working engineers in the electronics industry by the International Electronics Manufacturing Initiative (iNEMI) found that testing memory and memory buses on circuit boards is one of ...

“Spin Transfer Torque Magnetic Random Access Memory (STT-MRAM) is one of the most promising candidates to replace conventional embedded memory such as Static RAM and Dynamic RAM. However, due to the ...