DDR3的测试分为三类： 1、直流参数测试（DC Parameter Testing）：校验工作电流、电平、功率、扇出能力、漏电流等参数特性。内存的工作电流与功耗、负载有关，工作电流过高时，将造成功耗过高，给系统造成的负载过大，严重情况下将造成系统无法正常工作。

Modulation bandwidths continue to grow, promising higher data rates yet imposing test difficulties. Most test technologies are still rooted in past, narrowband architectures, which are increasingly ...

Semiconductor data sheets have changed a lot in the last few years, including growing from 10 pages to a hundred. The problem is that data sheets contain almost too much data, and there's not enough ...

CLEVELAND--(BUSINESS WIRE)--Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model ...

Beaverton, OR. Tektronix today introduced the customizable and fully integrated Keithley 4200A-SCS parameter analyzer, which accelerates semiconductor device, materials, and process insights by ...