Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

How a small molecule offers a new window into atomic-scale magnetism. (Nanowerk News) A Czech and Spanish-led research team has demonstrated the ability to distinguish subtle differences between ...

Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

A technical paper titled “High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy” was published by researchers at Oak Ridge National Laboratory, (ORNL), ...

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The roughness for the full image is already calculated and displayed, but a mask can be made to exclude certain areas from the roughness in the image. Click on the Mask Make button. This will make a ...

Atoms measure roughly 0.1 nanometers across, a scale so small that scientists spent more than six decades developing instruments capable of resolving them with any clarity. The journey from the first ...