Abbe test plate (for checking the spherical and chromatic aberration of microscope objectives) of the later strip form by Carl Zeiss, Jena. In fitted box with sector stop and instructions Abbe test ...

Researchers have proposed a new method to form an electron lens that will help reduce installation costs for electron microscopes with atomic resolution, proliferating their use. Instead of the ...

This year, the electron microscopy community marks the 25 th anniversary of the release of the first aberration-corrected transmission electron microscope. To celebrate the occasion, this article ...

IBM Corp. and Nion Co. said today their researchers have developed technology that allows them to look deep inside materials and view atoms interacting in different environments – at a resolution the ...

Researchers have shown that expensive aberration-corrected microscopes are no longer required to achieve record-breaking microscopic resolution. Researchers at the University of Illinois at ...

Researchers at the University of Illinois at Urbana-Champaign have shown for the first time that expensive aberration-corrected microscopes are no longer required to achieve record-breaking ...