Targeting characterization of communications and high-speed digital devices at the wafer level, the Model S600DC/RF APT (automated parametric test) system from Keithley Instruments (Cleveland, OH, www ...

The IoT represents a rapidly growing market for which high-speed wireless connections suitable for various usage systems are indispensable. The arrival of digital transportation is accelerating this ...

SANTA ROSA, Calif.--(BUSINESS WIRE)-- Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...

As semiconductor geometries become smaller and greater complexity is pushed into chips or packages, System Level Test (SLT) is becoming essential. SLT is testing a device under test (DUT) as it is ...

Taking a swipe at the cost of ownership, two additions to the Pyramid parametric probe card family allow single-pass DC and RF measurements, promising to reduce the cost of parametric production test ...

This is the second article of a three-part series discussing the likely impacts of next-generation consumer wireless semiconductor devices on instrumentation performance requirements. The first ...