With each device generation, the semiconductor content increases, leading to an increase in test complexity. This increase in test complexity is driving the need for more and more scan pattern memory.

Since ChatGPT and generative artificial intelligence (AI) hit the public consciousness in 2022, I've been exploring how well AI chatbots can write code. At first, the technology was a novelty, akin to ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...