In this digital world, it may be hard for some to believe that there’s still a place for anything manual or physical—especially in the engineering realm. And, while it’s true that today’s technologies ...

Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...

When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...

Virtual testing, based on system simulation and Model-Based Design,takes the traditional “test-at-the-end” system development process(represented in the V diagram ...

Memory test at-speed isn�t easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to ...

A product with the best technology might still fail if the user interface isn't easy to use and intuitive. You may have noticed the failure to consider one of the most important system components ...