In semiconductor manufacturing, especially in electrical test data, but also in other parameters, there are often sets of parameters that are very highly correlated. Even a change in the correlation ...

1. Aspects of multivariate analysis -- 2. Matrix algebra and random vectors -- 3. Sample geometry and random sampling -- 4. The multivariate normal distribution -- 5. Inferences about a mean vector -- ...

Understanding how structural defects affect the optoelectronic performance of silicon semiconductor wafers is critical for improving device efficiency and reliability. Simultaneous Raman and ...

A novel workflow combining comprehensive two-dimensional gas chromatography (GC×GC) with computer vision (CV) was developed to analyze the complex volatile profiles of coffee. By generating composite ...