Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique ...

Gross Margin -- 9.3%, within the 8%-10% guidance range, negatively impacted by a one-time $2.7 million sales incentive that ...