Abstract: This paper presents a 0.4-V bulk-driven two-stage operational transconductance amplifier (OTA) achieving an exceptionally high voltage gain exceeding 120 dB without requiring additional bias ...

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

In the vast reaches of the semiconductor cosmos, a silent menace lurks—one that can obliterate years of design work in a fraction of a nanosecond. Electrostatic discharge (ESD) verification stands as ...

Abstract: The channel in a resonant gate transistor (RGT) transduces the resonator’s mechanical movement into electrical signals. The device finds its application in acoustic sensing as a ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance.