After decades of intense research, surprises in the realm of semiconductors—materials used in microchips to control ...

Abstract: Gallium nitride (GaN) high electron mobility transistor (HEMT) devices are prone to rapid failure after repetitive short-circuit (SC) stress under high bus voltage conditions. The ...

ABSTRACT: Nanopillars have attracted considerable attention in nanoengineering because of their superior optical, chemical, and biological properties, which have led to their use in nanodevices and ...

Full-blown process excursions that affect every wafer are comparatively easy for fabs to detect and fix. However, “onesie-twosie,” lower-volume excursions can go unresolved for months or even years.

Lagging tech adoption and credit underwriting issues were likely contributors to loan quality worsening from a recent record-low rate, according to Aces Quality Management. Processing Content The ...

Crystals may seem flawless, but deep inside they contain tiny structural imperfections that dramatically influence their strength and behavior. Researchers from The University of Osaka have used the ...

Defect detection requirements on the order of 10 defective parts per million (DPPM) are driving improvements in inspection tools’ resolution and throughput at foundries and OSATs. However, defects ...

Stay up to date with everything that is happening in the wonderful world of AM via our LinkedIn community. According to Northwestern University, new research led by mechanical engineering professor ...

Helping to drive improvements in SiC power devices, advances in epitaxy are producing nearly defect-free layers of SiC on the carbon face, and those that that are free from basal plane dislocations on ...

This software provides dislocation-type defect identification and segmentation using a standard open source computer vision model, YOLO11, that leverages transfer learning to create a highly effective ...