Abstract: This work presents an inductive coupling method for detecting soft faults in cables. The scattering parameter ${S}_{{11}}$ of the cables is measured using a clamp-on inductive probe in ...
Abstract: In this work, time-dependent gate reliability studies were carried out on GaN high-electron-mobilitytransistors (HEMTs) under continuous DC gate bias ($\mathrm{V}_{\mathrm{GS}}$) and ...
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