System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...

As artificial intelligence fuels rapid growth in high-performance computing, it's also triggering a shift in how semiconductor chips are tested. Beyond leading AI GPU makers, major cloud ...

Tessent Streaming Scan Network (SSN) is a system for packetized delivery of scan test patterns. It enables simultaneous testing of any number of cores with few chip-level pins, and reduces test time ...

Today’s advanced driver assistance systems (ADAS) require unprecedented computing power – tasked with processing an incredible amount of data from sensors in real-time, making split-second decisions, ...