Abstract: Map-aided localization using 3D lidar scan points is an essential and fundamental technology in the field of Intelligent Vehicles (IVs) research, which can estimate the position and ...

Abstract: Wafer map defect classification is a crucial task in semiconductor manufacturing, as early detection of defects improves yield and minimizes production waste. This study proposes an enhanced ...

Nahda Nabiilah is a writer and editor from Indonesia. She has always loved writing and playing games, so one day she decided to combine the two. Most of the time, writing gaming guides is a blast for ...