A NEW research facility has opened in south Wales to support the development and scale-up of semiconductor materials manufactured in space.

Abstract: Visual inspection of surface defects in industrial products is crucial for quality control but remains challenging due to unpredictable and multiscale defects. Unsupervised anomaly detection ...

From quartz sand to silicon wafers, the manufacturing process is critical for achieving the purity and quality needed for advanced semiconductor applications.

Abstract: Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing ...