Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique reveals interface roughness affecting electron flow, enabling better ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips ...