Download the detailed syllabus PDF here. Check the section-wise topics, exam pattern, preparation strategy, and best books.

Abstract: Laser and heavy-ion data reveal the areas and shapes of single-event latchup (SEL)-sensitive regions in CMOS test structures and their positions relative to the affected p-n-p-n paths.

Abstract: Reflection and diffraction losses at 300 GHz were measured in a human body phantom with a mechanism to simulate breathing. The breathing-simulation mechanism uses a mechanism that produces ...