Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

How a small molecule offers a new window into atomic-scale magnetism. (Nanowerk News) A Czech and Spanish-led research team has demonstrated the ability to distinguish subtle differences between ...

Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...

A technical paper titled “High-speed mapping of surface charge dynamics using sparse scanning Kelvin probe force microscopy” was published by researchers at Oak Ridge National Laboratory, (ORNL), ...

Scientists use scanning tunneling microscopy to understand how a material's electronic or magnetic properties relate to its structure on the atomic scale. When using this technique, however, they can ...

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Go to the Mode Master. Select Offline Image. Click Browse in the AR Load Path Window to locate the directory you wish to use. If you were just imaging, the images you took during this session should ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...