A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

Abstract: The static and dynamic characteristics of 650 V class silicon carbide (SiC) semi-super-junction diodes (SJ-SBDs) with pure Schottky contacts, excluding ohmic contacts and MPS structures, ...

Abstract: Consecutive stages of femtosecond laser treatment of crystalline silicon, aiming in laser-induced periodic surface structure (LIPSS) formation, have been explored by means of real-time ...