Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

The ‘Tapping Mode SQUID-on-Tip’ (TM-SOT) microscope enables multimodal imaging to be performed extremely close to the sample surface using tapping mode feedback. This allows for stability during ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage ...

Abstract: The static and dynamic characteristics of 650 V class silicon carbide (SiC) semi-super-junction diodes (SJ-SBDs) with pure Schottky contacts, excluding ohmic contacts and MPS structures, ...