Abstract: The surface profiles of wafers affect the performance of the produced integrated circuit devices. Problems arising during wafer manufacturing, including imperfections in surface flatness, ...

Abstract: Phase-shifting profilometry is recognized as a key method in structured-light 3D reconstruction, mainly due to its excellent accuracy, rapid processing, and non-contact imaging features. It ...

"Pattern Matters: The Impact of Projection Patterns on Deep Learning 3D Profilometry" This repository contains tools for generating simulated datasets and training machine learning models to ...