Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

In the vast reaches of the semiconductor cosmos, a silent menace lurks—one that can obliterate years of design work in a fraction of a nanosecond. Electrostatic discharge (ESD) verification stands as ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance.

The research 'Impact of Contact Gating on Scaling of Monolayer 2D Transistors Using a Symmetric Dual-Gate Structure' appeared ...

A common lab setup can inflate 2D transistor performance by up to five times, raising questions about how future chips are ...

For nearly two decades, two-dimensional (2D) semiconductors have been studied as a complement or possible successor to silicon transistors, promising smaller, faster and more energy-efficient ...

For nearly two decades, two‑dimensional (2D) semiconductors have been studied as a complement or possible successor to silicon transistors, promising ...

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.

A new electrically controlled MXene membrane tunes ion separation on demand, opening doors to more efficient water treatment, drug delivery and rare earth mining. The membranes are made of stacks of ...

NTT researchers have addressed two primary loss mechanisms in AlN power transistors: the contact resistance and the channel resistance. To understand the potential of aluminum nitride (AlN) in power ...