Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

In the vast reaches of the semiconductor cosmos, a silent menace lurks—one that can obliterate years of design work in a fraction of a nanosecond. Electrostatic discharge (ESD) verification stands as ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance.

The research 'Impact of Contact Gating on Scaling of Monolayer 2D Transistors Using a Symmetric Dual-Gate Structure' appeared ...

For nearly two decades, two-dimensional (2D) semiconductors have been studied as a complement or possible successor to silicon transistors, promising smaller, faster and more energy-efficient ...

For nearly two decades, two‑dimensional (2D) semiconductors have been studied as a complement or possible successor to silicon transistors, promising ...

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.

Whenever tensions rise between Iran and the United States, one narrow waterway moves to the centre of global attention – the Strait of Hormuz. The world’s largest warship, the nuclear-powered aircraft ...

A new electrically controlled MXene membrane tunes ion separation on demand, opening doors to more efficient water treatment, drug delivery and rare earth mining. The membranes are made of stacks of ...

Abstract: We propose a novel transistor-level synthesis method to minimize the number of transistors needed to implement a digital circuit. In contrast with traditional standard cell design methods or ...

NTT researchers have addressed two primary loss mechanisms in AlN power transistors: the contact resistance and the channel resistance. To understand the potential of aluminum nitride (AlN) in power ...