Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips that can sabotage their performance. The imaging method, which was ...

Researchers used advanced electron ptychography to visualize atomic-scale defects inside modern transistors. The technique reveals interface roughness affecting electron flow, enabling better ...

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

Cornell researchers have used high-resolution 3D imaging to detect, for the first time, the atomic-scale defects in computer chips ...

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

Scientists at the Department of Energy's Lawrence Berkeley National Laboratory (Berkeley Lab) have developed a new way to determine atomic structures from nanocrystals previously considered unusable, ...

The ‘Tapping Mode SQUID-on-Tip’ (TM-SOT) microscope enables multimodal imaging to be performed extremely close to the sample surface using tapping mode feedback. This allows for stability during ...

Transmission electron microscopes (TEMs) allow researchers at the forefront of energy technology to study next-generation battery materials down to ...

Large protein machines in the body carry out many of the cell's most essential tasks, from energy production to the ...

FTIR microscopy offers a strong method for detecting and characterizing contaminants, crucial for ensuring product safety and ...

Researchers at Lawrence Berkeley National Laboratory have developed a 4D-STEM workflow that can isolate and solve atomic structures from individual nanocrystals buried inside dense, tangled clusters, ...

Not all defects are visible with the same microscope. Explore how resolution, contrast, and signal interpretation shape ...