Abstract: Automatic test pattern generation (ATPG) is a key technology in digital circuit testing. In this paper, we propose an ATPG method based on deep reinforcement learning (DRL), aiming to reduce ...
Abstract: A machine-learning-assisted optimization (MLAO) method for antenna geometry design (AGD) (MLAO-AGD) is proposed. By combining machine learning (ML) methods, including a convolutional neural ...
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