The accelerating rate at which the industry adopts new process nodes is posing critical test challenges. Shrinking geometries combined with increased design complexity with respect to metrics such as ...

With each device generation, the semiconductor content increases, leading to an increase in test complexity. This increase in test complexity is driving the need for more and more scan pattern memory.

Just a day after NASA launched its Lunar Trailblazer spacecraft on a multi-month, ultra-efficient journey to the Moon, it ...