Photo-reflectance spectroscopy enhances semiconductor quality control with sensitive, contactless measurements of band structure and electric fields in devices.

Polarization describes the orientation of electromagnetic waves as they propagate through space, representing one of light's fundamental properties alongside wavelength and intensity. In spectroscopy, ...

A new technical paper titled “Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology” was published by researchers at Samsung. “We propose an ultra-wide-field ...

The Nature Index 2025 Research Leaders — previously known as Annual Tables — reveal the leading institutions and countries/territories in the natural and health sciences, according to their output in ...

Artificial intelligence is one of the driving forces in today’s semiconductor industry, with more traditional market drivers like high performance compute and smart phones continuing to play important ...

The Nature Index 2025 Research Leaders — previously known as Annual Tables — reveal the leading institutions and countries/territories in the natural and health sciences, according to their output in ...

Abstract: Spectroscopic ellipsometry is a very sensitive metrology technique to accurately measure the thickness and the refractive index of the different layers present on specific dedicated ...

Abstract: We proposed spectroscopic ellipsometry employing dual-optical-comb spectroscopy. We demonstrated the ellipsometric evaluation of a high-order quarter waveplate and a SiO 2 thin film standard ...

SENTECH Instruments, a supplier of plasma process technology equipment for etching and deposition and thin film metrology instruments based on spectroscopic ellipsometry has announced the new ...

ABSTRACT: Possible early diagnostic application of optical methods (dielectrophoresis, spectral and imaging ellipsometry, Fourier-transform infrared spectroscopy, Raman spectroscopy) in studies of red ...